Semiconductor-characterization system

July 11, 2001

The Model 4200-SCS semiconductor characterization system performs lab-grade dc device characterization with realtime plotting and analysis. Built-in software helps with setup, data collection, analysis, and data storage. To speed measurements, an instrument structure allows simultaneous measurement of up to eight different measurement channels, and software needs only one mouse click to move between tests. A curve-trace application provides mouse-click access to view multiple on-screen data plots, automatic sequencing, and standard built-in test libraries. The software is a device-characterization application written for operation under Windows NT. The application provides test definition, parameter analysis and graphing, and automation.