The ATEasy 5.0 test executive and development software for automated test equipment now comes with a new fault library.
The library creates a troubleshooting tool for analyzing electronic fault conditions by the ATEasy software during runtime. Included is a fault editor that lets program developers define fault conditions, permitting operator prompting for the replacement of components or subassemblies based on actual test failures. Other improvements include built-in support for IVI drivers, support for .NET components, a touchscreen user interface, import of functions directly from C/C++ header files, and support for 64-bit signed and unsigned integers.
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